Material Characterization


Scanning probe microscopy (SPM), namely scanning tunnelling microscopy (STM) and atomic force microscopy (AFM), allow characterization and modification of surfaces at the nanoscale. 

The activity at SENSOR is mainly focused on AFM-based techniques. The microscope works in different AFM-modes (contact, non-contact, tapping, Top) including DAC, height and phase imaging. 

Moreover, SENSOR Lab equipment is able to combine SPM with many other techinques. Please refer to Facilities page for further details.

SnO2 nanowire with Au tip



Optical Properties

Mechanical Properties

Electrical Characterization