Maurizio Donarelli was born in L’Aquila, Italy, in 1983.
He received his Master Degree in Physics – Applied Physics Curriculum – in 2010, with a thesis entitled “Use of X-ray interference lithography for photonics applications”, from University of L’Aquila, Italy.
He received his PhD in Physics from the Department of Physical and Chemical Sciences of the University of L’Aquila, Italy, defending a thesis entitled “Electronic properties and potential device applications of exfoliated MoS2”, in 2014. During his PhD, his research activity was mainly focused on electronic and morphological properties of low-dimensional materials, in particular 2D materials different from graphene, like molybdenite.
In December 2013 he joined the Sensor Lab. His research activity mainly deals on fabrication and characterization of single metal oxide nanowire devices. He has experience on electron beam lithography and on several characterization techniques like scanning electron and atomic force microscopies, surface profilometry, X-ray and UV photoelectron spectroscopies.